A
three axis, fluxgate to be used to obtain measurements of
the Earth's magnetic field vector to determine the attitude of a spacecraft.
The
advent of large LEO (low Earth orbiting) satellite networks, has significantly
increased the need for high reliability, radiation hardened, attitude
control s. Existing instruments suffer from shortcomings in
the areas of radiation hardness, power consumption/isolation and (economical)
manufacturability in large quantities. The TFM100S described
was designed to address these issues and provides significant improvement
over our earlier design, which is used on IRIDIUMTM and other programs.
RADIATION
HARDNESS
The
TFM100S was designed for LEO spacecraft to meet the radiation hardness
requirements necessitated by operation within the inner Van Allen Belt.
This radiation environment can cause performance degradation by producing
ionized particles in the silicon (Si) and silicon dioxide (SiO2)
layers of semiconductors, increasing leakage currents [1]
[2]. The required on-orbit
lifetimes of >12 years for future satellite networks, such as TELEDESICTM,
make long term ionizing radiation effects the most likely constraint of
useful instrument life. The new instrument design was implemented using
inherently radiation tolerant analog and digital integrated circuits.
This is an improvement over the earlier design which used
older (30 years) radiation-hardened 4000 series CMOS logic chips. This
logic family is at or near obsolescence, relatively expensive, and can
require procurement times of >10 months. Total ionizing dose (TID)
testing was performed on an unshielded instrument at NASA Goddard Space
Flight Center's Cobalt 60 Radiation Test Facility in Greenbelt, Maryland.
Testing was performed for 14 days at a dose rate of 16 RADs per minute
or 23 kRADs per day for a TID of >300 kRADS. The test was concluded
after 14 days as allocated facility time had expired. The instrument was
re-tested after radiation exposure. Parametric shifts were minimal (zero
offset change <7 nanoTesla) and the easily met all specifications.
The actual flight s will be shielded by aluminum instrument
housings having a wall thickness of >25 mm. The housing and incidental
spacecraft structure shielding will greatly increase the ionizing radiation
tolerance of the instrument beyond the 300 kRAD test level. The
reduces the probability of damage by SEE , SEU, SEL and SEGR (Single Event
Effects, Upset, Latchup and Gate Rupture) by a fail-safe current limiting
power supply and the exclusion of power MOSFETS in the instrument design.
POWER
CONVERTER
The
power convertor is a very simple design using the "isolated flyback"
[3] topology and is implemented
using an intrinsically radiation tolerant, bipolar integrated circuit.
The convertor transformer is driven by a single bipolar switching transistor
having a breakdown voltage >200 VDC. This configuration gives reliable
operation over an input voltage range between 10 and 120 VDC at a nearly
constant conversion efficiency. This wide range of operation was necessary
because many of the upcoming LEO satellite designs have not yet defined
their power busses. At least one program is considering an unregulated
buss of about 100 VDC. The power convertor provides total isolation (to
>500 VDC breakdown) between power and signal grounds. This allows the
spacecraft designers to select the optimum grounding configuration, between
telemetry and the power buss, for best system noise rejection. The convertor
design has been radiation tested to >300 kRADs and power on-off cycled
to >325,000 times without "hang-up" or failure.
SENSOR
CORE TYPE
 |
|
Figure
1. Vacquier probe and ring core sensor. |
Billingsley
Magnetics manufactures Ring Core, Racetrack [4]
[5] , and Vacquier [6]
sensors. The three different types of fluxgate sensor elements were evaluated
to select the one most suitable for this new design. The evaluation testing
of all three types was done with the sensors configured for the (low noise)
voltage mode [7] of operation.
The Ring core sensors were fabricated, using a proprietary technique,
to eliminate "crossfield effects". The "Crossfield Effect"
is an apparent shift in sensor axial alignment when different perpendicular
fields are applied. The effect is usually negligible with perpendicular
fields of >20 mTesla but can cause apparent alignment shifts of 0.5-1
degree or even greater in fields of 60 mTesla (earth's field). A
rotating spacecraft, in low earth orbit, could have an incremental uncertainty
in its attitude determination by this amount. Toroidal geometry sensors
can be especially susceptible to this error source. Ring core sensors
were ultimately selected as we have corrected the crossfield effect, and
consequently they represent the best overall tradeoff of performance relative
to the needs of an attitude control . Table
1 describes the considerations which resulted in this selection.
Figure 1 depicts a Vacquier
probe and a ring core sensor.
Top of Page
Table
1. DESIGN TRADEOFFS FOR SPACECRAFT ATTITUDE CONTROL SENSORS |
CHARACTERISTIC
EVALUATED |
FLUXGATE
SENSOR TYPE |
| |
RING
CORE |
RACE
TRACK CORE |
VACQUIER
(TWO ELEMENT) PROBE |
Noise
(RMS/ROOT/Hz @ 1Hz) |
12
pT typical to 4 pT
(vs. IRIDIUM >75 pT) |
6pT
typical to 3pT |
25
pT |
| Drive
Power |
Lowest
- 2 cores |
Moderate
- 3 cores |
Higher
-3 cores (open magnetic path, requires more drive power) |
| Manufacturability |
Best |
Most
Difficult |
More
difficult than ring cores |
| Zero
stability vs. Temperature |
Good |
Very
good |
Excellent |
| Ruggedness
/ Resistance to Shock |
Excellent |
Good |
Excellent |
| Temperature
coefficient of scale factor |
Good |
Excellent |
Excellent |
| Full
scale linearity (fields up to 1 Gauss) |
<0.005% |
0.0018
% |
0.0018% |
| Cost |
Lowest |
Highest |
Intermediate |
| "Crossfield
effect" (errors due to large perpendicular fields) |
(TFM100S
design corrects to near zero)(non-linear above 20 µT on older IRIDIUM
type ring cores) |
Excellent
(low and high fields) |
Very
good (linear, appears as a small misalignment of sensors) |
TESTING
In
the past, high performance s were flown (and tested) at a
rate of a few per year. In contrast, today's large constellations of spacecraft
requires production of a several per day on average. Data acquisition
and analysis software was developed to achieve the levels of automation
required to produce the instrument in large quantities within a limited
time schedule. The tests which have historically been most time consuming,
cost drivers, are described below.
NOISE
/ FREQUENCY RESPONSE
The
is placed in a "six level" magnetic shield (fluxtank) and
connected to the noise test setup. This setup consists of a 40 dB low
noise amplifier, a 0.005 Hz Krohn-Hite high-pass filter, a Stanford Research
SR770 FFT spectrum analyzer, and a PC running BMATS DAQ (Billingsley Magnetics
Automatic Test System) software. This test is performed automatically
and repeated for the instrument's other two axes. The spectrum analyzer
accumulates at least 1024 data samples and then averages the RMS noise
at 1 Hz. Frequency response is measured using the SR770's internal frequency
source to stimulate the sensor under test.
LINEARITY
/ ORTHOGONALITY
The
instrument is placed in a closed loop Helmholtz coil system. A minimum
of ten field values, per axis, between ± full scale are applied and the
resultant data are fitted to a straight line using a "least squares
fit" algorithm. A report is generated which graphically and numerically
represents the results. The sensor's orthogonality is calculated using
the dot products of the generated field values.
TFM100S
SPECIFICATIONS
Specifications |
| Radiation
Tolerance |
>306kRADs |
| Axial
Alignment (Orthogonality) |
better than ± 1° ; ± 0.5° special; calibration
data provided to ± 0.1° |
| Input
Voltage |
+ 14 to + 45 VDC (or) +45 to +125 VDC |
| Input
Current |
20 mA @ 28 Volts |
| Field
Measurement Range |
±
100 µTesla |
| Accuracy |
±
0.5% of full scale |
| Linearity |
0.015% of full scale |
| Sensitivity |
100 µV per nanoTesla |
| Scale
Factor Temperature Shift |
0.0075% full scale per °C |
| Output
Ripple |
3 mV peak to peak @ 2nd harmonic |
| Analog
Output @ Zero Field |
±
0.025 volt (to .002 with optional trim) |
| Zero
Shift with Temperature |
±
0.6 nanoTesla per °C |
| Susceptibility
to Perming |
±
25 nanoTesla shift with ± 5 Gauss applied |
| Output
Impedance |
332 Ohms ± 5% |
| Frequency
Response |
- 3 dB @ > 150 Hz |
| EMI |
CEO1, CEO3, REO2, CS01, CSO2, CSO6, RSO1, RSO2, RS03 |
| Random
Vibration |
20G RMS (20 Hz to 2 KHz) |
| Shock |
>230G |
| Temperature
Range |
- 40° to + 85°C operating |
| Weight |
200 grams (shielded to 306 kRADs) |
| Size |
3.66 cm x 3.58 cm x 15.44 cm |
| Connector |
(chassis mounted) 9 pin male "D" type gold-plated, mil-spec, non-magnetic
(mating connector supplied) |
REFERENCES
|
-
M.C.
Maher, Radiation Design Test Data for Advanced CMOS Product,
National Semiconductor Application Note 925, January 1994.
-
Joel
M. Goldberg, Understand Radiation Hardening, Test and
Measurement World, August 1997.
-
Carl
Nelson, LT1070 Design Manual, Linear Technology Corporation,
AN-19 June 1986.
-
Pavel
Ripka, Race-Track Fluxgate Sensors, Czech Technical
University, Electrotechnical Faculty Department of Measurements,
166 27 Prague 6 (Czech Republic).
-
P.
Ripka, K. Draxler and P. Kaspar, Race-Track Fluxgate Gradiometer,
Electronic Letters 24 June 1993 Vol. 29 No.13.
-
Fritz
Primdahl, The Fluxgate Mechanism, IEEE TRANSACTIONS
ON MAGNETICS Vol. MAG-6, No. 2, June 1970; pp.376-383.
-
Pavel
Ripka, S.W. Billingsley, Fluxgate: Current vs. Voltage
Output, invited paper presented at the 7th Joint MMM-Intermag
Conference January 6-9, 1998, San Francisco, California.
|
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